DocumentCode :
2051442
Title :
Causes of cracks in SMD and type-specific remedies
Author :
Omi, Susumu ; Fujita, Kazuya ; Tsuda, Takaaki ; Maeda, Takamichi
Author_Institution :
Sharp Corp., Nara, Japan
fYear :
1991
fDate :
11-16 May 1991
Firstpage :
766
Lastpage :
771
Abstract :
Packages used with surface mount devices (SMDs) have the unique reliability problem of package cracks produced by soldering stress. Package cracks are classified into three distinct modes, depending on the location of origin and direction of spread. In type I, the crack originates on one edge of the die pad and spreads to the bottom side of the package. In type II, the crack originates on one edge of the die pad and spreads to the top surface of the package. In type III, the crack spreads from an edge of the chip to the top surface of the package. To remedy this cracking problem, it is necessary to determine the type of cracking that may occur, and take a countermeasure specific to each type. The authors investigated possible causes for each type of package crack, and techniques for crackproof package design optimized for individual crack types were developed. The following three techniques for anticrack package design, or a combination of two or more, have proved effective: (1) molding compound with improved resistance to soldering heat, (2) polyimide coating on the back side of the die pad, and (3) improved lead frame design
Keywords :
circuit reliability; packaging; soldering; surface mount technology; thermal stress cracking; SMDs; anticrack package design; crackproof package design; die pad; lead frame design; molding compound; package cracks; polyimide coating; reliability; soldering stress; surface mount devices; type-specific remedies; Electronic packaging thermal management; Electronics packaging; Integrated circuit packaging; Lead; Moisture; Packaging machines; Resins; Semiconductor device packaging; Soldering; Surface cracks;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1991. Proceedings., 41st
Conference_Location :
Atlanta, GA
Print_ISBN :
0-7803-0012-2
Type :
conf
DOI :
10.1109/ECTC.1991.163966
Filename :
163966
Link To Document :
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