• DocumentCode
    2051457
  • Title

    A prototype low-noise sixty-four channel readout card for the PHENIX muon tracker cathode strip detector subsystem

  • Author

    Cafferty, M.M. ; Britton, C.L. ; Lee, D.M. ; Carey, T. ; Emery, M.S. ; Halliwell, J. ; Musrock, M.S. ; Robinson, S.H. ; Young, G.R.

  • Author_Institution
    Los Alamos Nat. Lab., NM, USA
  • Volume
    2
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    765
  • Abstract
    The development and test results of a prototype sixty-four channel readout card with emphasis on the eight-channel preamplifier/shaping amplifier ASIC design and performance are presented. Design objectives for the preamplifier include; less than 3000 electrons (rms) of noise for 150 pF of detector capacitance, integration time of 700 ns to 1 us over the range of detector capacitance values from 10 pF to 250 pF, return to baseline of less than 100 us, gain of about 3.5 mV/fC and 11 bits of dynamic range. The nominal power consumption is about 70 mA at a supply voltage of 5V. The readout card design integrates eight of the preamplifier ASICs and two thirty-two channel AMU/ADC (Analog Memory Unit/Analog to Digital Converter (12-bit)) ASICs onto a 6U format printed circuit board. Both ASICs were designed at Oak Ridge National Laboratory while the readout card was designed at Los Alamos National Laboratory
  • Keywords
    analogue-digital conversion; application specific integrated circuits; muon detection; nuclear electronics; preamplifiers; pulse shaping circuits; readout electronics; 150 pF; ASICs; PHENIX muon tracker cathode strip detector subsystem; detector capacitance; eight-channel preamplifier/shaping amplifier ASIC; prototype low-noise sixty-four channel readout card; readout card design; Application specific integrated circuits; Capacitance; Detectors; Dynamic range; Electrons; Laboratories; Noise shaping; Preamplifiers; Prototypes; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium, 1999. Conference Record. 1999 IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-5696-9
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1999.845780
  • Filename
    845780