Title :
Measuring and simulating EMI on very small components at high frequencies
Author :
Decrock, Lieven ; Catrysse, Johan ; Vanhee, F. ; Pissoort, Davy
Author_Institution :
Network Solutions - DataComm, TE Connectivity, Oostkamp, Belgium
Abstract :
A new test method has been implemented for testing the EMC performance of small components like small connectors and IC´s, mainly used in mobile applications. The test method is based on the EMC-stripline method. Both emission and immunity can be tested up to 6GHz, based on good RF matching conditions and with high field strengths.
Keywords :
electromagnetic compatibility; electromagnetic interference; immunity testing; printed circuit testing; strip lines; EMC performance; EMC-stripline method; EMI; IC; RF matching conditions; electromagnetic emission; electromagnetic immunity; high field strengths; mobile applications; small connectors; very small components; Couplings; Electromagnetic compatibility; Electromagnetic interference; Frequency measurement; Impedance; Microstrip; Stripline; EMC; EMI-stripline; TEM-cell; small components;
Conference_Titel :
Electromagnetic Compatibility (EMC EUROPE), 2013 International Symposium on
Conference_Location :
Brugge
