Stochastic EMI sources localization algorithm based on time domain planar near-field scanning

Localization algorithm for stochastic EMI sources based on time domain planar near-field scanning of tangential electromagnetic field components emitted by a complex radiated structure is presented. The main theory aspects of the field reconstruction in the object plane as well as the main limitations for scanning parameters are also discussed for the proposed localization procedure. The autocorrelation and cross-correlation functions obtained by using the two-point planar scanning system are used for the characterization of stochastic field distribution. An example of point sources localization both in frequency and spatial domain is presented based on the modeling and measurement results.