Title :
Simultaneous magnetic force microscopy and magnetoresistance characterization of a magnetic tunnel junction with in-situ applied field
Author :
Leib, J.S. ; Baker, B.J. ; Shen, Y.P. ; Snyder, J.E. ; Kawaguchi, Tatsuki ; Jiles, D.C.
Author_Institution :
Dept. of Mater. Sci. & Eng., Iowa State Univ., Ames, IA, USA
fDate :
March 30 2003-April 3 2003
Abstract :
In this paper, both the magneto-electronic properties and the magnetic domain structure of a magnetic tunnel junction (MJT) have been characterized simultaneously.
Keywords :
chromium alloys; cobalt alloys; iron alloys; magnetic domains; magnetic force microscopy; magnetic multilayers; magnetic tunnelling; magnetoresistance; manganese alloys; nickel alloys; praseodymium alloys; NiFe-CoFe-CrPrMn; Si; magnetic domain structure; magnetic force microscopy; magnetic tunnel junction; magneto-electronic properties; magnetoresistance; Electrical resistance measurement; Magnetic devices; Magnetic domains; Magnetic field measurement; Magnetic flux; Magnetic force microscopy; Magnetic forces; Magnetic multilayers; Magnetic tunneling; Tunneling magnetoresistance;
Conference_Titel :
Magnetics Conference, 2003. INTERMAG 2003. IEEE International
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-7647-1
DOI :
10.1109/INTMAG.2003.1230673
