Title : 
Systematic study of double-layered ultra-thin stacked patch absorbers
         
        
            Author : 
Herrera, Claudia ; Vandenbosch, Guy A. E.
         
        
            Author_Institution : 
Telemic, Katholieke Univ. Leuven, Leuven, Belgium
         
        
        
        
        
        
            Abstract : 
We present a sensitivity study of a double-layered metamaterial absorber with two stacked patches. Two parameters of the topology are systematically tuned: the thickness of the top layer, and the size of the top patch. When parameters are tuned properly, a single-resonance-like behaviour with two resonators can be seen. Absorptions of more than 99 % can be achieved, despite the simplicity of the structure.
         
        
            Keywords : 
electromagnetic wave absorption; metamaterials; double-layered metamaterial absorber; double-layered ultra-thin stacked patch absorbers; single-resonance-like behaviour; topology; Absorption; Bandwidth; Electromagnetic compatibility; Frequency response; Metamaterials; Reflectivity; Resonant frequency;
         
        
        
        
            Conference_Titel : 
Electromagnetic Compatibility (EMC EUROPE), 2013 International Symposium on
         
        
            Conference_Location : 
Brugge