DocumentCode
2051682
Title
Room temperature scanning micro-Hall probe microscopy under extremely large pulsed magnetic fields
Author
Sandhu, A. ; Masuda, H. ; Oral, A.
Author_Institution
Res. Centre for Quantum Effect Electron., Tokyo Inst. of Technol., Japan
fYear
2003
fDate
March 30 2003-April 3 2003
Abstract
In this paper, we describe the use of pulsed magnetic field as a well established method for producing extremely large fields but the integration of pulse coils and peripheral instrumentation with the RT-SHPM necessitates extreme care due to the adverse effects of external vibrations during continuous magnetic imaging measurements.
Keywords
Hall effect devices; coils; magnetic field effects; scanning probe microscopy; 293 to 298 K; magnetic imaging measurement; pulse coils; pulsed magnetic field; room temperature scanning micro-Hall probe microscopy; Ambient intelligence; Atomic force microscopy; Hall effect devices; Magnetic field measurement; Magnetic fields; Magnetic force microscopy; Probes; Pulse measurements; Temperature; Vibration measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 2003. INTERMAG 2003. IEEE International
Conference_Location
Boston, MA, USA
Print_ISBN
0-7803-7647-1
Type
conf
DOI
10.1109/INTMAG.2003.1230675
Filename
1230675
Link To Document