Title :
Room temperature scanning micro-Hall probe microscopy under extremely large pulsed magnetic fields
Author :
Sandhu, A. ; Masuda, H. ; Oral, A.
Author_Institution :
Res. Centre for Quantum Effect Electron., Tokyo Inst. of Technol., Japan
fDate :
March 30 2003-April 3 2003
Abstract :
In this paper, we describe the use of pulsed magnetic field as a well established method for producing extremely large fields but the integration of pulse coils and peripheral instrumentation with the RT-SHPM necessitates extreme care due to the adverse effects of external vibrations during continuous magnetic imaging measurements.
Keywords :
Hall effect devices; coils; magnetic field effects; scanning probe microscopy; 293 to 298 K; magnetic imaging measurement; pulse coils; pulsed magnetic field; room temperature scanning micro-Hall probe microscopy; Ambient intelligence; Atomic force microscopy; Hall effect devices; Magnetic field measurement; Magnetic fields; Magnetic force microscopy; Probes; Pulse measurements; Temperature; Vibration measurement;
Conference_Titel :
Magnetics Conference, 2003. INTERMAG 2003. IEEE International
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-7647-1
DOI :
10.1109/INTMAG.2003.1230675
