• DocumentCode
    2051746
  • Title

    Flip-chip interconnection technology for advanced thermal conduction modules

  • Author

    Ray, S.K. ; Beckham, K. ; Master, R.

  • Author_Institution
    IBM Corp., East Fishkill, NY, USA
  • fYear
    1991
  • fDate
    11-16 May 1991
  • Firstpage
    772
  • Lastpage
    778
  • Abstract
    Area array solder bumps on silicon devices, known as C4 balls, have been successfully used in terminating logic and memory devices to ceramic substrates in numerous IBM products over two decades. With the IBM System 390/ES9000 series of mainframe computers, this highly reliable chip termination technology has achieved improved interconnection density and total number of chip I/O connections per module. In addition, in the models 820 and 900 of ES9000 series, a novel materials set, namely glass-ceramic with Cu internal metallization along with thin-film redistribution wiring on top, has been introduced for multilayered ceramic substrates. Key elements of advanced glass-ceramic substrate technology relevant to flip-chip joining are reviewed. This is followed by a discussion of device join and replace processes used in advanced thermal conduction modules which also have decoupling capacitors which are attached by C4 solder reflow. Optimization of the top surface metallurgy and device join parameters necessary to achieve reliable joining of more than 70000 solder balls per module is discussed
  • Keywords
    flip-chip devices; integrated circuit technology; microassembling; modules; packaging; soldering; C4 balls; C4 solder reflow; Cu internal metallization; MLC substrates; Si; advanced thermal conduction modules; area array solder bumps; chip termination technology; device join parameters; flip-chip joining; glass-ceramic substrate; interconnection technology; multilayered ceramic substrates; thin-film redistribution wiring; Ceramics; Inorganic materials; Logic arrays; Logic devices; Metallization; Silicon devices; Substrates; Thermal conductivity; Transistors; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1991. Proceedings., 41st
  • Conference_Location
    Atlanta, GA
  • Print_ISBN
    0-7803-0012-2
  • Type

    conf

  • DOI
    10.1109/ECTC.1991.163967
  • Filename
    163967