DocumentCode
2051892
Title
High-voltage micro discharge in ultra-low background 3He proportional counters
Author
Heeger, K.M. ; Elliott, S.R. ; Robertson, R.G.H. ; Smith, M.W.E. ; Steiger, T.D. ; Wilker, J.F.
Author_Institution
Nucl. Phys. Lab., Washington Univ., Seattle, WA, USA
Volume
2
fYear
1999
fDate
1999
Firstpage
838
Abstract
This paper discusses the phenomenon of surface micro discharge induced by high voltage and techniques for the reduction and discrimination of such breakdowns in ultra-low background proportional counters. An array of ultra-low background 3He-filled proportional counters will measure the neutral-current interaction rate of all active neutrino species in the Sudbury Neutrino Observatory. The sensitivity of these Neutral Current Detectors and their stringent background criteria make it essential to minimize all spurious pulses including signals induced by high voltage. Such pulses can originate from microscopic surface discharges in the various proportional counter components. Studies have shown that this discharge effect occurs mainly at interfaces and in microscopic voids between dielectric surfaces, on contaminated surfaces, and on surfaces with imperfections. Because of its occurrence in various materials and environments, micro discharge is a concern for all low-background detectors that operate under high voltage
Keywords
cosmic ray apparatus; helium-3 counters; neutron detection; surface discharges; He; Sudbury Neutrino Observatory; active neutrino species; contaminated surfaces; high-voltage micro discharge; neutral-current interaction rate; stringent background criteria; surface micro discharge; ultra-low background 3He proportional counters; ultra-low background proportional counters; Breakdown voltage; Counting circuits; Detectors; Dielectrics; Microscopy; Neutrino sources; Observatories; Pollution measurement; Surface contamination; Surface discharges;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium, 1999. Conference Record. 1999 IEEE
Conference_Location
Seattle, WA
ISSN
1082-3654
Print_ISBN
0-7803-5696-9
Type
conf
DOI
10.1109/NSSMIC.1999.845796
Filename
845796
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