DocumentCode
2051922
Title
A data mining approach to incremental adaptive functional diagnosis
Author
Bolchini, Cristiana ; Quintarelli, Elisa ; Salice, Fabio ; Garza, Paolo
Author_Institution
Dip. Elettron., Inf. e Bioingegneria, Politec. di Milano, Milan, Italy
fYear
2013
fDate
2-4 Oct. 2013
Firstpage
13
Lastpage
18
Abstract
This paper presents a novel approach to functional fault diagnosis adopting data mining to exploit knowledge extracted from the system model. Such knowledge puts into relation test outcomes with components failures, to define an incremental strategy for identifying the candidate faulty component. The diagnosis procedure is built upon a set of sorted, possibly approximate, rules that specify given a (set of) failing test, which is the faulty candidate. The procedure iterative selects the most promising rules and requests the execution of the corresponding tests, until a component is identified as faulty, or no diagnosis can be performed. The proposed approach aims at limiting the number of tests to be executed in order to reduce the time and cost of diagnosis. Results on a set of examples show that the proposed approach allows for a significant reduction of the number of executed tests (the average improvement ranges from 32% to 88%).
Keywords
data mining; fault diagnosis; components failures; data mining approach; faulty component identification; functional fault diagnosis; incremental adaptive functional diagnosis; knowledge extraction; system model; Association rules; Circuit faults; Data models; Fault diagnosis; Fault tolerance; Fault tolerant systems;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2013 IEEE International Symposium on
Conference_Location
New York City, NY
ISSN
1550-5774
Print_ISBN
978-1-4799-1583-5
Type
conf
DOI
10.1109/DFT.2013.6653576
Filename
6653576
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