DocumentCode :
2052018
Title :
The final barriers to widespread use of IDDQ testing
Author :
Acken, John M.
Author_Institution :
CrossCheck Technol. Inc., San Jose, CA, USA
fYear :
1995
fDate :
21-25 Oct 1995
Firstpage :
300
Abstract :
IDDQ testing is required for high quality products. Several barriers to IDDQ testing have fallen. This is due to the rising importance of testing, quality, and CAD tool integration of design and test. Both theory and practice have demonstrated the value of IDDQ testing methodologies. Three key issues still hinder widespread utilization of IDDQ. The first issue is how does I DDQ compete with other test methods. The second issue is what measurement techniques can be used. And the third issue is how to set the IDDQ current limit to catch defective parts without rejecting defect-free parts. The thesis of this presentation is that the issues are being actively worked, and the barriers will fall
Keywords :
CMOS integrated circuits; automatic testing; circuit CAD; design for testability; electric current measurement; integrated circuit testing; CAD tool integration; CMOS IC; IDDQ testing; barriers; defect-free parts; defective parts; high quality products; Batteries; Circuit testing; Current measurement; Current supplies; Design automation; Fabrication; Measurement techniques; Power supplies; Semiconductor device measurement; Sequential analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1995. Proceedings., International
Conference_Location :
Washington, DC
ISSN :
1089-3539
Print_ISBN :
0-7803-2992-9
Type :
conf
DOI :
10.1109/TEST.1995.529852
Filename :
529852
Link To Document :
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