DocumentCode :
2052047
Title :
DaemonGuard: O/S-assisted selective software-based Self-Testing for multi-core systems
Author :
Skitsas, Michael A. ; Nicopoulos, Chrysostomos A. ; Michael, Maria K.
Author_Institution :
Dept. of ECE, Univ. of Cyprus, Nicosia, Cyprus
fYear :
2013
fDate :
2-4 Oct. 2013
Firstpage :
45
Lastpage :
51
Abstract :
As technology scales deep into the sub-micron regime, transistors become less reliable. Future systems are widely predicted to suffer from considerable aging and wear-out effects. This ominous threat has urged system designers to develop effective run-time testing methodologies that can monitor and assess the system´s health. In this work, we investigate the potential of online software-based functional testing at the granularity of individual microprocessor core components in multi-core systems. While existing techniques monolithically test the entire core, our approach aims to reduce testing time by avoiding the over-testing of under-utilized units. To facilitate fine-grained testing, we introduce DaemonGuard, a framework that enables the real-time observation of individual sub-core modules and performs on-demand selective testing of only the modules that have recently been stressed. The monitoring and test-initiation process is orchestrated by a transparent, minimally-intrusive, and lightweight operating system process that observes the utilization of individual datapath components at run-time. We perform a series of experiments using a full-system, execution-driven simulation framework running a commodity operating system, real multi-threaded workloads, and test programs. Our results indicate that operating-system-assisted selective testing at the sub-core level leads to substantial savings in testing time and very low impact on system performance.
Keywords :
automatic test software; built-in self test; multiprocessing systems; operating systems (computers); DaemonGuard; OS plug-in; multicore microprocessors; multicore systems; operating-system-assisted selective testing; selective testing; software based self-testing; sub-core level; submicron regime; test daemon; testing manager; Benchmark testing; Hardware; Multicore processing; Operating systems; Radiation detectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2013 IEEE International Symposium on
Conference_Location :
New York City, NY
ISSN :
1550-5774
Print_ISBN :
978-1-4799-1583-5
Type :
conf
DOI :
10.1109/DFT.2013.6653581
Filename :
6653581
Link To Document :
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