Title :
Modeling of internal mechanical tension´s influence on electric strength of M-D-M-structures under electric breakdown
Author :
Matviykiv, Myhaylo ; Petrushka, Alina
Author_Institution :
Lviv Polytech. Nat. Univ., Lviv, Ukraine
Abstract :
Deformation changes of electric strength of M-D-M-structures under electric, ionization and electrochemical breakdown, caused by internal mechanical tensions, are modeling in the article. Determined mathematical models which take into account main mechanisms of internal mechanical tension´s influence on M-D-M-structure´s electric strength are represented.
Keywords :
MIM structures; deformation; electric breakdown; electromechanical effects; M-D-M-structures; deformation; electric breakdown; electric strength; electrochemical breakdown; internal mechanical tension; mathematical models; Acceleration; Atomic measurements; Conductivity; Deformable models; Electric breakdown; Electrons; Integrated circuit modeling; Ionization; Mathematical model; Microassembly; Deformation; Electric breakdown; Electric strength; Film; Internal mechanical tensions;
Conference_Titel :
Modern Problems of Radio Engineering, Telecommunications and Computer Science (TCSET), 2010 International Conference on
Conference_Location :
Lviv-Slavske
Print_ISBN :
978-966-553-875-2
Electronic_ISBN :
978-966-553-901-8
