DocumentCode :
2052379
Title :
LMS-based RF BIST architecture for multistandard transmitters
Author :
Dogaru, Emanuel ; Vinci Dos Santos, Filipe ; Rebernak, William
Author_Institution :
Thales Dept. on Adv. Analog Design, SUPELEC, Gif-sur-Yvette, France
fYear :
2013
fDate :
2-4 Oct. 2013
Firstpage :
131
Lastpage :
136
Abstract :
Software defined radios (SDR) platforms are increasingly complex systems which combine great flexibility and high performance. These two characteristics, together with highly integrated architectures make production test a challenging task. In this paper, we introduce a Radio Frequency (RF) Built-in Self-Test (BIST) strategy based on Periodically Nonuniform Sampling of the signal at the output stages of multistandard radios. We leverage the I/Q ADC channels and the DSP resources to extract the bandpass waveform at the output of the power amplifier (PA). Analytical expressions and simulations show that our time-interleaved conversion scheme is sensitive to time-skew. We propose a time-skew estimation technique based on a Least Mean Squares (LMS) algorithm to solve this problem. Simulation results show that we can effectively reconstruct the bandpass signal of the output stage using this architecture, opening the way for a complete RF BIST strategy for multistandard radios.
Keywords :
analogue-digital conversion; band-pass filters; built-in self test; digital signal processing chips; least mean squares methods; power amplifiers; radio transmitters; software radio; DSP resources; I/Q ADC channel; LMS algorithm; LMS-based RF BIST architecture; RF BIST strategy; SDR platforms; bandpass signal; bandpass waveform; complex systems; least mean squares algorithm; multistandard radios; multistandard transmitters; periodically nonuniform sampling; power amplifier; production test; radio frequency built-in self-test strategy; software defined radio platforms; time-interleaved conversion scheme; time-skew estimation technique; Built-in self-test; Computer architecture; Delays; Least squares approximations; Mathematical model; Nonuniform sampling; Radio frequency; BIST; LMS calibration; Periodically nonuniform sampling; mixed-signal test; software radios; spectral mask estimation; time-skew estimation; undersampling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2013 IEEE International Symposium on
Conference_Location :
New York City, NY
ISSN :
1550-5774
Print_ISBN :
978-1-4799-1583-5
Type :
conf
DOI :
10.1109/DFT.2013.6653595
Filename :
6653595
Link To Document :
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