On-state reliability of solid-electrolyte switch

Author

Banno, N. ; Sakamoto, T. ; Fujieda, S. ; Aono, M.

Author_Institution

Device Platforms Res. Labs., NEC Corp., Sagamihara

fYear

2008

fDate

April 27 2008-May 1 2008

Firstpage

707

Lastpage

708

Abstract

We examined the ON-state reliability of a solid electrolyte resistive switch,named ldquoNanoBridgerdquo, for programmable logic application. We found a trade-off between turn-off current and ON-state reliability and optimized the ON conductance. Through this optimization, we obtained high durability against DC current of ~0.2 mA at 105degC for 10 years and low turn-off current less than 5 mA. NanoBridge can thus meet the requirements for programmable logic applications.

Keywords

copper; copper compounds; durability; microswitches; nanoelectronics; platinum; programmable logic devices; reliability; solid electrolytes; tantalum compounds; Cu-Cu₂S-Pt; Cu-Ta₂O₅-Pt; ON conductance; ON-state reliability; durability; nanobridge; programmable logic application; solid electrolyte resistive switch; temperature 105 degC; time 10 year; turn-off current; Circuits; Current measurement; Electrodes; Materials reliability; Nanoscale devices; Programmable logic arrays; Programmable logic devices; Solids; Switches; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability Physics Symposium, 2008. IRPS 2008. IEEE International

Conference_Location

Phoenix, AZ

Print_ISBN

978-1-4244-2049-0

Electronic_ISBN

978-1-4244-2050-6

Type

conf

DOI

10.1109/RELPHY.2008.4558999

Filename

4558999