Title :
Characterizing infant mortality in high volume manufacturing
Author :
Vassighi, Arman ; Kacprowicz, Richard ; Carranza, Carlos ; Riordan, Walter
Author_Institution :
Intel Corp., Hillsboro, OR
fDate :
April 27 2008-May 1 2008
Abstract :
Due to the large sample sizes required, certain reliability modeling parameters for infant mortality cannot be measured during technology development with desired confidence levels by engineering experiments. Among these reliability modeling parameters is thermal energy activation (Ea). Ea is used in the Arrhenius equation to calculate the burn-in time for integrated circuits. A small change in this parameter can have a great impact in burn-in time. In this work we have measured this parameter in high volume manufacturing (HVM) in 65 nm technology using naturally occurring data by applying novel new techniques at virtually no cost.
Keywords :
integrated circuit manufacture; integrated circuit reliability; integrated circuit testing; Arrhenius equation; burn-in test; burn-in time calculation; high volume manufacturing; infant mortality characterization; integrated circuits; reliability modeling parameters; size 65 nm; thermal energy activation; Costs; Equations; Integrated circuit measurements; Integrated circuit reliability; Integrated circuit technology; Manufacturing; Power engineering and energy; Reliability engineering; Size measurement; Volume measurement;
Conference_Titel :
Reliability Physics Symposium, 2008. IRPS 2008. IEEE International
Conference_Location :
Phoenix, AZ
Print_ISBN :
978-1-4244-2049-0
Electronic_ISBN :
978-1-4244-2050-6
DOI :
10.1109/RELPHY.2008.4559004
