An approach for designing total-dose tolerant MCMs based on current monitoring

This paper presents a new technique for designing reliable multichip modules (MCMs) under radiation effects for spacecraft electronics. The technique is based on current monitoring to detect faults induced by ionizing radiation in dies mounted on the MCM. These faults change transistor electrical parameters and increase power consumption due to increased leakage current. In addition to this fundamental benefit, the proposed approach can also be used to assess product quality during manufacturing testing