An approach for designing total-dose tolerant MCMs based on current monitoring

Author

Vargas, F. ; Nicolaidis, M. ; Zorian, Y.

Author_Institution

TIMA/INPG Lab., Grenoble, France

fYear

1995

fDate

21-25 Oct 1995

Firstpage

345

Lastpage

354

Abstract

This paper presents a new technique for designing reliable multichip modules (MCMs) under radiation effects for spacecraft electronics. The technique is based on current monitoring to detect faults induced by ionizing radiation in dies mounted on the MCM. These faults change transistor electrical parameters and increase power consumption due to increased leakage current. In addition to this fundamental benefit, the proposed approach can also be used to assess product quality during manufacturing testing

Keywords

leakage currents; multichip modules; production testing; radiation hardening (electronics); space vehicle electronics; current monitoring; ionizing radiation; leakage current; manufacturing testing; power consumption; product quality; radiation effects; spacecraft electronics; total-dose tolerant MCMs; transistor electrical parameters; Aerospace electronics; Electrical fault detection; Energy consumption; Ionizing radiation; Leakage current; Multichip modules; Radiation detectors; Radiation effects; Radiation monitoring; Space vehicles;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1995. Proceedings., International

Conference_Location

Washington, DC

ISSN

1089-3539

Print_ISBN

0-7803-2992-9

Type

conf

DOI

10.1109/TEST.1995.529859

Filename

529859