Title :
Simultaneous measurement of soft error rate of 90 nm CMOS SRAM and cosmic ray neutron spectra at the summit of Mauna Kea
Author :
Tosaka, Yoshiharu ; Takasu, Ryozo ; Uemura, Taiki ; Ehara, Hideo ; Matsuyama, Hideya ; Satoh, Shigeo ; Kawai, Atsushi ; Hayashi, Masahiko
Author_Institution :
Fujitsu Labs. Ltd., Tokyo
fDate :
April 27 2008-May 1 2008
Abstract :
We carried out simultaneous measurement of SERs and cosmic ray neutron spectra for the first time. We measured SERs using 90 nm CMOS SRAM chips and measured neutron spectra using a Bonner multisphere spectrometer. We carried out the SER field measurement at the 4200 m summit of Mauna Kea, which is the most suitable place for SER field measurements because the neutron flux is over 10 times greater there than that at sea level. Therefore, we could avoid making field measurements that usually require a long measuring time (about a year) to obtain sufficient accuracy.
Keywords :
CMOS memory circuits; SRAM chips; cosmic ray interactions; electric field measurement; integrated circuit measurement; neutron flux; neutron spectra; radiation hardening (electronics); Bonner multisphere spectrometer; CMOS SRAM; Mauna Kea summit; SER field measurement; cosmic ray neutron spectra; neutron flux; size 90 nm; soft error rate measurement; Error analysis; Extraterrestrial measurements; Machine shops; Neutrons; Random access memory; Sea measurements; Semiconductor device measurement; Spectroscopy; Telescopes; Time measurement;
Conference_Titel :
Reliability Physics Symposium, 2008. IRPS 2008. IEEE International
Conference_Location :
Phoenix, AZ
Print_ISBN :
978-1-4244-2049-0
Electronic_ISBN :
978-1-4244-2050-6
DOI :
10.1109/RELPHY.2008.4559009