• DocumentCode
    2052735
  • Title

    Simultaneous measurement of soft error rate of 90 nm CMOS SRAM and cosmic ray neutron spectra at the summit of Mauna Kea

  • Author

    Tosaka, Yoshiharu ; Takasu, Ryozo ; Uemura, Taiki ; Ehara, Hideo ; Matsuyama, Hideya ; Satoh, Shigeo ; Kawai, Atsushi ; Hayashi, Masahiko

  • Author_Institution
    Fujitsu Labs. Ltd., Tokyo
  • fYear
    2008
  • fDate
    April 27 2008-May 1 2008
  • Firstpage
    727
  • Lastpage
    728
  • Abstract
    We carried out simultaneous measurement of SERs and cosmic ray neutron spectra for the first time. We measured SERs using 90 nm CMOS SRAM chips and measured neutron spectra using a Bonner multisphere spectrometer. We carried out the SER field measurement at the 4200 m summit of Mauna Kea, which is the most suitable place for SER field measurements because the neutron flux is over 10 times greater there than that at sea level. Therefore, we could avoid making field measurements that usually require a long measuring time (about a year) to obtain sufficient accuracy.
  • Keywords
    CMOS memory circuits; SRAM chips; cosmic ray interactions; electric field measurement; integrated circuit measurement; neutron flux; neutron spectra; radiation hardening (electronics); Bonner multisphere spectrometer; CMOS SRAM; Mauna Kea summit; SER field measurement; cosmic ray neutron spectra; neutron flux; size 90 nm; soft error rate measurement; Error analysis; Extraterrestrial measurements; Machine shops; Neutrons; Random access memory; Sea measurements; Semiconductor device measurement; Spectroscopy; Telescopes; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 2008. IRPS 2008. IEEE International
  • Conference_Location
    Phoenix, AZ
  • Print_ISBN
    978-1-4244-2049-0
  • Electronic_ISBN
    978-1-4244-2050-6
  • Type

    conf

  • DOI
    10.1109/RELPHY.2008.4559009
  • Filename
    4559009