Title :
SPC on the IC-production test process
Author :
Van der Peet, Jos ; Van Boxem, Ger
Author_Institution :
Consumer IC Ind., Philips Semicond. BV, Nijmegen, Netherlands
Abstract :
A novel monitor for the error sources of the test process is found. It is independent of the tested product and does not disturb the production flow. It can be used to control the test process during production (SPC). Implementation of SPC using these monitors is described, with results and conclusions
Keywords :
computerised monitoring; integrated circuit testing; integrated circuit yield; production engineering computing; production testing; statistical process control; IC-production test process; SPC; SPC software tool; error source monitoring; monitor; test process control; yield improvement; Condition monitoring; Flow production systems; Fluid flow measurement; Information analysis; Integrated circuit noise; Integrated circuit testing; Process control; Production facilities; Reproducibility of results; Signal processing;
Conference_Titel :
Test Conference, 1996. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-3541-4
DOI :
10.1109/TEST.1996.557117
