DocumentCode :
2052787
Title :
Development of integral equation solution for 3D eddy current distribution in a conducting slab
Author :
O-Mun Kwon ; Chari, M.V.K. ; Salon, S. ; Sivasubramaniam, K.
Author_Institution :
Dept. of Electr. Comput. & Syst. Eng., Rensselaer Polytech. Inst., Troy, NY, USA
fYear :
2003
fDate :
March 30 2003-April 3 2003
Abstract :
Eddy current analysis finds wide application in electrical machinery and devices, in power system analysis, non destructive testing, continuous casting, ship board applications and others. Finite Element methods such as T-Omega, A-phi and A-V methods do provide solutions of acceptable accuracy for small problems where the element size is comparable to skin-depth. Even for this, a large number of elements are required to model the entire space of the conducting medium and the surrounding air region. Integral equations require modeling of only the conducting parts and therefore offer an alternative approach to the problem. This paper presents an integral equation analysis and its application to a conducting slab with and without a crack excited by a transmission line source, to a slab excited by a dipole source, to phase segregated bus bars and others.
Keywords :
busbars; cracks; eddy current testing; finite element analysis; integral equations; segregation; 3D eddy current distribution; conducting slab; continuous casting; cracks; electrical devices; electrical machinery; finite element methods; integral equation solution; nondestructive testing; phase segregation busbars; power system analysis; ship board applications; transmission line source; Casting; Eddy current testing; Eddy currents; Finite element methods; Integral equations; Machinery; Marine vehicles; Power system analysis computing; Slabs; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2003. INTERMAG 2003. IEEE International
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-7647-1
Type :
conf
DOI :
10.1109/INTMAG.2003.1230720
Filename :
1230720
Link To Document :
بازگشت