Title :
Modelling and control of a 2-DOF planar parallel manipulator for semiconductor packaging systems
Author :
Cheung, Jacob W F ; Hung, Y.S.
Author_Institution :
Dept. Electr. & Electron. Eng., Hong Kong Univ.
Abstract :
A novel direct-drive planar parallel manipulator for high-speed and high-precision semiconductor packaging systems is presented. High precision kinematics design, significant reduction on moving mass and driving power of the actuators over traditional XY motion stages are the benefits of the proposed manipulator. The mathematical model of the manipulator is obtained using the Newton-Euler method and a practical model-based control design approach is employed to design the PID computed-torque controller. Experimental results demonstrate that the proposed planar parallel manipulator has significant improvements on motion performance in terms of positioning accuracy, settling time and stability when compared with traditional XY stages. This shows that the proposed planar parallel manipulator can provide a superior alternative for replacing traditional XY motion stages in high precision low-payload applications
Keywords :
Newton method; industrial manipulators; manipulator dynamics; manipulator kinematics; packaging machines; position control; semiconductor device packaging; three-term control; torque control; 2DOF planar parallel manipulator; Newton-Euler method; PID computed-torque controller; direct-drive manipulator; high precision low-payload applications; high-precision semiconductor packaging systems; high-speed systems; manipulator control; manipulator dynamics; manipulator kinematics; manipulator mathematical model; motion performance; Actuators; Jacobian matrices; Kinematics; Manipulator dynamics; Mathematical model; Power system modeling; Prototypes; Semiconductor device packaging; Service robots; Three-term control;
Conference_Titel :
Advanced Intelligent Mechatronics. Proceedings, 2005 IEEE/ASME International Conference on
Conference_Location :
Monterey, CA
Print_ISBN :
0-7803-9047-4
DOI :
10.1109/AIM.2005.1511067