• DocumentCode
    2053710
  • Title

    Design, Fabrication and Measurement of a Resonant Tunneling Diode Based Micro Accelerometer

  • Author

    Xiong, Jijun ; Mao, Haiyang ; Zhang, Wendong ; Xue, Chenyang

  • Author_Institution
    Key Lab. of Instrum. Sci. & Dynamic Meas., North Univ.
  • fYear
    2006
  • fDate
    18-21 Jan. 2006
  • Firstpage
    382
  • Lastpage
    386
  • Abstract
    Several piezoresistive micro accelerometers have been commercially used, nevertheless, their sensitivity is not high enough for some special applications. A novel ´piezoresistive´ micro accelerometer based on resonant tunneling diode (RTD) is proposed in this work, it is reported to be of higher sensitivity. To preliminarily study such a structure as well as the RTD, a testing system is designed and established, using a semiconductor parameter analyzer, an electronic scanning probe station and a Raman spectroscopy together with its fiber testing system. The piezoresistive properties of RTD and the accelerometer engaged RTD are detected. The experimental results demonstrate that the piezoresistive sensitivity of RTD is larger than 1 times 10-8 Pa-1, which is much higher than that of silicon piezoresistive property. While the piezoresistive sensitivity of the accelerometer engaged RTD is 2 times 10-10 Pa-1
  • Keywords
    accelerometers; micromechanical devices; piezoresistance; resonant tunnelling diodes; Raman spectroscopy; electronic scanning probe station; fiber testing system; piezoresistive micro accelerometers; piezoresistive sensitivity; resonant tunneling diode; semiconductor parameter analyzer; Accelerometers; Electronic equipment testing; Fabrication; Piezoresistance; Probes; Raman scattering; Resonant tunneling devices; Semiconductor device testing; Semiconductor diodes; System testing; 1-V characteristic; GaAs; Resonant tunneling diode; piezoresistive effect; sensitivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems, 2006. NEMS '06. 1st IEEE International Conference on
  • Conference_Location
    Zhuhai
  • Print_ISBN
    1-4244-0139-9
  • Electronic_ISBN
    1-4244-0140-2
  • Type

    conf

  • DOI
    10.1109/NEMS.2006.334763
  • Filename
    4134975