• DocumentCode
    2053935
  • Title

    VLSI implementation for Epileptic Seizure Prediction System based on wavelet and chaos theory

  • Author

    Hung, Shao-Hang ; Chao, Chih-Feng ; Wang, Shu-Kai ; Lin, Bor-Shyh ; Lin, Chin-Teng

  • Author_Institution
    Inst. of Electr. & Control Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • fYear
    2010
  • fDate
    21-24 Nov. 2010
  • Firstpage
    364
  • Lastpage
    368
  • Abstract
    This paper presents a very large scale integration (VLSI) circuit implementation for Epileptic Seizure Prediction System based combination of wavelet and chaos theory. The system consists with operation units of discrete wavelet transform (DWT), correlation dimension (CD), and correlation coefficient. This work discovered by certain bandwidth of signal extraction with DWT, and the combination with Chaotic features analysis, it can achieve a higher accuracy of epileptic prediction. Furthermore, the correlation coefficient between two correlation dimensions with different embedding dimensions was proposed as a novel feature for epileptic seizure prediction in this study. The proposed system was evaluated with intracranial Electrocorticography (ECoG) recordings from a set of eleven patients with refractory temporal lobe epilepsy (TLE). The accuracy of experiment result for all subjects can achieve 87%, and a false prediction rate is 0.24/h. In average warning time occur about 27 min ahead the ictal.
  • Keywords
    VLSI; bioelectric phenomena; biomedical equipment; brain; chaos; medical disorders; medical signal processing; neurophysiology; VLSI implementation; chaos theory; chaotic features analysis; correlation coefficient; correlation dimension; discrete wavelet transform; epileptic seizure prediction system; intracranial electrocorticography recordings; refractory temporal lobe epilepsy; very large scale integration circuit implementation; wavelet theory; Correlation Dimension; Discrete Wavelet Transform; ECoG; Seizure Prediction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    TENCON 2010 - 2010 IEEE Region 10 Conference
  • Conference_Location
    Fukuoka
  • ISSN
    pending
  • Print_ISBN
    978-1-4244-6889-8
  • Type

    conf

  • DOI
    10.1109/TENCON.2010.5686655
  • Filename
    5686655