DocumentCode
2053935
Title
VLSI implementation for Epileptic Seizure Prediction System based on wavelet and chaos theory
Author
Hung, Shao-Hang ; Chao, Chih-Feng ; Wang, Shu-Kai ; Lin, Bor-Shyh ; Lin, Chin-Teng
Author_Institution
Inst. of Electr. & Control Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
fYear
2010
fDate
21-24 Nov. 2010
Firstpage
364
Lastpage
368
Abstract
This paper presents a very large scale integration (VLSI) circuit implementation for Epileptic Seizure Prediction System based combination of wavelet and chaos theory. The system consists with operation units of discrete wavelet transform (DWT), correlation dimension (CD), and correlation coefficient. This work discovered by certain bandwidth of signal extraction with DWT, and the combination with Chaotic features analysis, it can achieve a higher accuracy of epileptic prediction. Furthermore, the correlation coefficient between two correlation dimensions with different embedding dimensions was proposed as a novel feature for epileptic seizure prediction in this study. The proposed system was evaluated with intracranial Electrocorticography (ECoG) recordings from a set of eleven patients with refractory temporal lobe epilepsy (TLE). The accuracy of experiment result for all subjects can achieve 87%, and a false prediction rate is 0.24/h. In average warning time occur about 27 min ahead the ictal.
Keywords
VLSI; bioelectric phenomena; biomedical equipment; brain; chaos; medical disorders; medical signal processing; neurophysiology; VLSI implementation; chaos theory; chaotic features analysis; correlation coefficient; correlation dimension; discrete wavelet transform; epileptic seizure prediction system; intracranial electrocorticography recordings; refractory temporal lobe epilepsy; very large scale integration circuit implementation; wavelet theory; Correlation Dimension; Discrete Wavelet Transform; ECoG; Seizure Prediction;
fLanguage
English
Publisher
ieee
Conference_Titel
TENCON 2010 - 2010 IEEE Region 10 Conference
Conference_Location
Fukuoka
ISSN
pending
Print_ISBN
978-1-4244-6889-8
Type
conf
DOI
10.1109/TENCON.2010.5686655
Filename
5686655
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