• DocumentCode
    2054233
  • Title

    Frequency dependent AC breakdown and pre-breakdown current of thin polyimide films prepared by vapor deposition polymerization

  • Author

    Itoh, Eiji ; Miyairi, Keiichi

  • Author_Institution
    Shinshu Univ. & Electron. Eng., Nagano, Japan
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    71
  • Lastpage
    74
  • Abstract
    Dielectric breakdown of thin polyimide films prepared by vapor deposition polymerization has been investigated for various AC voltages. Real time measurements were made automatically with a system composed of a digital oscilloscope controllable signal generator and microcomputer The AC electric strength decreases with temperature, and it increases with frequency in the range of 10 Hz - 3 kHz, The pre-breakdown current was also measured using the bridge circuit. The very large conductive current and the abnormal current peak due to the polarity reversal were also observed. The frequency dependence of the electric strength has been discussed in terms of the probability of the establishment of the conductive path and the distortion of electric field leading to the breakdown
  • Keywords
    electric breakdown; electric strength; organic insulating materials; polymer films; polymerisation; 10 Hz to 3 kHz; abnormal current peak; ac electric strength; bridge circuit; conductive current; conductive path; controllable signal generator; dielectric breakdown; digital oscilloscope; electric field distortion; frequency dependence; frequency dependent ac breakdown; polarity reversal; polyimide films; pre-breakdown current; real time measurements; vapor deposition polymerization; Chemical vapor deposition; Current measurement; Dielectric breakdown; Dielectric thin films; Electric breakdown; Electric variables measurement; Frequency dependence; Frequency measurement; Polyimides; Polymer films;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulating Materials, 2001. (ISEIM 2001). Proceedings of 2001 International Symposium on
  • Conference_Location
    Himeji
  • Print_ISBN
    4-88686-053-2
  • Type

    conf

  • DOI
    10.1109/ISEIM.2001.973565
  • Filename
    973565