DocumentCode
2054481
Title
Application of ECT technique for inspection of bare PCB
Author
Yamada, S. ; Nakamura, K. ; Iwahara, M. ; Taniguchi, T. ; Wakiwaka, H.
Author_Institution
Kanazawa Univ., Japan
fYear
2003
fDate
March 30 2003-April 3 2003
Abstract
In this paper, we describe the probe structure and characteristics to apply the ECT approach to high-density PCB with narrow trace width.
Keywords
coils; eddy current testing; pick-ups; printed circuits; probes; solenoids; PCB; eddy current testing; probe structure; Coils; Conductors; Eddy currents; Electrical capacitance tomography; Image processing; Inspection; Magnetic flux; Printed circuits; Probes; Transmitters;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 2003. INTERMAG 2003. IEEE International
Conference_Location
Boston, MA, USA
Print_ISBN
0-7803-7647-1
Type
conf
DOI
10.1109/INTMAG.2003.1230788
Filename
1230788
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