Title :
Application of ECT technique for inspection of bare PCB
Author :
Yamada, S. ; Nakamura, K. ; Iwahara, M. ; Taniguchi, T. ; Wakiwaka, H.
Author_Institution :
Kanazawa Univ., Japan
fDate :
March 30 2003-April 3 2003
Abstract :
In this paper, we describe the probe structure and characteristics to apply the ECT approach to high-density PCB with narrow trace width.
Keywords :
coils; eddy current testing; pick-ups; printed circuits; probes; solenoids; PCB; eddy current testing; probe structure; Coils; Conductors; Eddy currents; Electrical capacitance tomography; Image processing; Inspection; Magnetic flux; Printed circuits; Probes; Transmitters;
Conference_Titel :
Magnetics Conference, 2003. INTERMAG 2003. IEEE International
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-7647-1
DOI :
10.1109/INTMAG.2003.1230788
