Title :
Study on Space Morphology of Molecular Structure by AFM
Author :
Yang, Xueheng ; Zhong, Hongjie ; Tang, Taiguo ; Bai, Haihui ; Liu, Anping ; Wang, Yinfeng ; Han, Xianwu ; Su, Xiaoping
Author_Institution :
Heng-Rui Nano-Technol. Centre, Chongqing Univ.
Abstract :
The study on small molecular space morphology of nanometer material by a high-resolution Atomic Force Microscopy (AFM) is introduced in this paper. The high-resolution AFM.IPC-208B was developed by Chongqing University, and its precision: lateral resolution is 0.1 nm, vertical resolution is 0.01 nm. Applying AFM.IPC-208B, we obtained the surface structures of five samples (natural white mica, polyimide, ZnO and thin films of CdIn2O4, V2O5). Through observing, the surface three-dimensional images are reconstructed, meanwhile corresponding molecular structures and structural parameters are analyzed and obtained. The scanning area to every sample is only 5-10 nm. The obtained results on molecular structure of the five materials by AFM.IPC-208B have never been seen in overseas or home reports
Keywords :
atomic force microscopy; cadmium compounds; molecular configurations; organic compounds; surface morphology; vanadium compounds; zinc compounds; AFM.IPC-208B; CdIn2O4; CdIn2O4 thin film; V2O5; ZnO; atomic force microscopy; high resolution AFM; molecular structure space morphology; molecular structures; nanometer material; natural white mica; polyimide; structural parameters; surface 3D images; surface structures; vanadium oxide thin film; zinc oxide; Atomic force microscopy; Image reconstruction; Nanostructured materials; Polyimides; Structural engineering; Surface morphology; Surface reconstruction; Surface structures; Transistors; Zinc oxide; AFM; CdIn2O4; Mica; Molecular Structure; Polyimide; V2O5; ZnO;
Conference_Titel :
Nano/Micro Engineered and Molecular Systems, 2006. NEMS '06. 1st IEEE International Conference on
Conference_Location :
Zhuhai
Print_ISBN :
1-4244-0139-9
Electronic_ISBN :
1-4244-0140-2
DOI :
10.1109/NEMS.2006.334848
