• DocumentCode
    2054809
  • Title

    A measurement system based on capacitance sensors for geometric errors of a miniaturized machine tool

  • Author

    Lee, J.H. ; Liu, Y. ; Kweon, S.H. ; Yang, S.H. ; Kim, Y.S.

  • Author_Institution
    Graduate Sch. of Mech. Eng., Kyungpook Nat. Univ., Daegu
  • fYear
    2005
  • fDate
    24-28 July 2005
  • Firstpage
    1114
  • Lastpage
    1119
  • Abstract
    Miniaturized machine tool (mMT) has been presented as a promising technique for machining miniature components due to its advantages such as miniaturized error sources, less heat dissipation and no limitation of the materials. To achieve submicron machining accuracy, geometric errors of a miniaturized machine tool should be accurately identified and compensated. In this paper, a novel multi-degree-of-freedom (DOF) measuring system is proposed for simultaneous measurement of two straightness, roll, yaw and pitch error motions along one moving axis of a miniaturized machining tool. The proposed system consists of five capacitance sensors and a sensing target. Readings of the sensors contain coupled information of all error motions. Based on homogeneous transformation matrix (HTM), the coupled relationships between the readings and error motions are obtained. An error estimation algorithm is developed for calculation of five geometric errors. Simulations are carried out to verify estimation accuracy and robustness of the algorithm
  • Keywords
    capacitive sensors; machine tools; measurement systems; micromachining; capacitance sensors; error estimation algorithm; geometric errors; homogeneous transformation matrix; measurement system; miniaturized machine tool; submicron machining accuracy; Aerospace materials; Calibration; Capacitance measurement; Capacitive sensors; Error analysis; Laboratories; Machine tools; Machining; Mechanical engineering; Sensor systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Intelligent Mechatronics. Proceedings, 2005 IEEE/ASME International Conference on
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    0-7803-9047-4
  • Type

    conf

  • DOI
    10.1109/AIM.2005.1511159
  • Filename
    1511159