Title :
The effect of period generation techniques on period resolution and waveform jitter in VLSI test systems
Author :
Davis, Michael G.
Author_Institution :
LTX/Trillium, San Jose, CA, USA
Abstract :
This paper presents a comparison of three approaches to achieving period resolution in VLSI test systems. It explains the strengths and weaknesses of each approach, from the user´s point of view, with an emphasis on the jitter produced by each approach
Keywords :
VLSI; automatic testing; clocks; integrated circuit testing; jitter; phase locked loops; waveform generators; HF clock; PLL; VLSI test systems; flip-flip; flying adder method; period averaging; period generation techniques; period resolution; test rate; tester periods; timing generators; variable frequency clock; vernier linearity; waveform jitter; Clocks; Control systems; Counting circuits; Frequency; Jitter; Phase locked loops; Pulse generation; System testing; Timing; Very large scale integration;
Conference_Titel :
Test Conference, 1996. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-3541-4
DOI :
10.1109/TEST.1996.557126
