Title :
High-speed and simple estimation algorithm of waveform distortions using a 43-Gb/s SiGe-based eye-Monitoring LSI
Author :
Yoshida, N. ; Noguchi, H. ; Abe, J. ; Uchida, H. ; Ozaki, M. ; Kanemitsu, S. ; Wada, S. ; Amamiya, Y.
Author_Institution :
NEC Corp., Kawasaki
Abstract :
We propose a high-speed and simple estimation algorithm of waveform distortions using a 43-Gb/s SiGe-based eye-monitoring LSI, and experimentally demonstrate precise estimations of PMD and chromatic dispersion.
Keywords :
Ge-Si alloys; optical fibre dispersion; semiconductor materials; PMD; Si-Ge; bit rate 43 Gbit/s; chromatic dispersion; eye-monitoring LSI; polarization mode dispersion; waveform distortions; Chromatic dispersion; Circuits; Clocks; Delay estimation; Large scale integration; Monitoring; National electric code; Optical distortion; Optical fiber dispersion; Phase estimation;
Conference_Titel :
Optical Communication, 2008. ECOC 2008. 34th European Conference on
Conference_Location :
Brussels
Print_ISBN :
978-1-4244-2227-2
Electronic_ISBN :
978-1-4244-2228-9
DOI :
10.1109/ECOC.2008.4729281
