Title :
Symbol rate dependency of XPM-induced phase noise penalty on QPSK-based modulation formats
Author :
Vassilieva, O. ; Hoshida, T. ; Rasmussen, J.C. ; Naito, T.
Author_Institution :
Fujitsu Labs. of America Inc., Richardson, TX
Abstract :
Systematic investigation of XPM impact on QPSK signals reveals that higher symbol rates are advantageous for reducing both intra-span generation and multi-span accumulation of phase noise.
Keywords :
phase modulation; phase noise; quadrature phase shift keying; QPSK signal; QPSK-based modulation; XPM impact; XPM-induced phase noise penalty; cross-phase modulation; intraspan generation; multispan accumulation; symbol rate dependency; Channel spacing; Laboratories; Modulation; Optical fiber polarization; Optical signal processing; Phase detection; Phase noise; Phase shift keying; Quadrature phase shift keying; Signal generators;
Conference_Titel :
Optical Communication, 2008. ECOC 2008. 34th European Conference on
Conference_Location :
Brussels
Print_ISBN :
978-1-4244-2227-2
Electronic_ISBN :
978-1-4244-2228-9
DOI :
10.1109/ECOC.2008.4729288
