• DocumentCode
    2055966
  • Title

    Modeling of the resistance between metal electrodes and metallic SWNT

  • Author

    Al-Hamry, Ammar ; Benchirouf, A. ; Dinh, N. ; Kanoun, O.

  • Author_Institution
    Electr. Eng. & Inf. Technol., Chemnitz Univ. of Technol., Chemnitz, Germany
  • fYear
    2012
  • fDate
    20-23 March 2012
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Contact effects of carbon nanotubes (CNT) to metallic electrodes have a big impact on the electronic transport in CNT-based structures. In general there are two expected types of contacts, Schottky type with semiconducting tubes and ohmic contact with semiconducting and metallic tubes. However not always perfect contacts come, it is rather a tunneling barrier contact because of the weak coupling to the metal electrode or the formation of thin layer of oxides at the interface, for example. We propose a simple model for non-ideal contacts of metallic single walled nanotube (SWNT) in order to calculate the overall resistance and hence the contact resistance. The model takes into account the findings of both experiments and theories such as effect of work function, electron phonon scattering in low and high bias voltage, image potential and van der Waals distance at the interface. The model can be developed to calculate the contact resistance for strips of several SWNTs or multiwalled carbon nanotubes MWNTs.
  • Keywords
    carbon nanotubes; electric resistance; van der Waals forces; bias voltage; carbon nanotubes; contact effects; electron phonon scattering; electronic transport; image potential; metallic SWNT; metallic electrodes; metallic single walled nanotube; non-ideal contacts; resistance; van der Waals distance; Carbon nanotubes; Contact resistance; Electrodes; Electron tubes; Metals; Resistance; Scattering; SWNT; WKB; contact resistance; image potential; tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Systems, Signals and Devices (SSD), 2012 9th International Multi-Conference on
  • Conference_Location
    Chemnitz
  • Print_ISBN
    978-1-4673-1590-6
  • Electronic_ISBN
    978-1-4673-1589-0
  • Type

    conf

  • DOI
    10.1109/SSD.2012.6198071
  • Filename
    6198071