• DocumentCode
    2056140
  • Title

    Non-contact multilayer thickness measurements with reflection-mode terahertz time-domain spectroscopy

  • Author

    Feige, V.K.S. ; Nix, S. ; Ellrich, F. ; Jonuscheit, J. ; Beigang, R.

  • Author_Institution
    Autom. Dr. Nix GmbH & Co. KG, Koln, Germany
  • fYear
    2011
  • fDate
    22-26 May 2011
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    The global increase of plastic production has led to an increase in coating materials available for plastics, as many plastics need to be protected from environmental factors such as light, solvents and other chemicals. For this reason the coating of plastics is a useful example for the coating thickness measurement on non-metal surfaces. Analogies can also be found in many other areas such as the wood and building industry. Terahertz (THz) waves penetrate nonconductive coatings and are reflected at the boundary layers between different refraction indices. This creates new potential for quality control when added to the already established non destructive testing techniques such as ultrasonic or x-ray. On the basis of practical relevance we have chosen the perpendicular reflection geometry for the investigation of the coating systems. The terahertz pulses were generated using the photo-Dember effect on an InAs surface emitter using a modelocked Ti:sapphire laser with approx. 100 fs short pulses at a center wavelength of about 800 nm (xu et al., 1992). The generated THz pulses are sampled using delayed laser pulses. The individual delay and the corresponding field strength are recorded via a PC-based data acquisition unit.
  • Keywords
    III-V semiconductors; indium compounds; laser mode locking; light reflection; measurement by laser beam; optical pulse generation; sapphire; terahertz spectroscopy; thickness measurement; titanium; Al2O3:Ti; InAs; PC-based data acquisition unit; boundary layers; building industry; coating materials; coating systems; coating thickness measurement; delayed laser pulses; environmental factors; field strength; modelocked Ti:sapphire laser; nonconductive coatings; noncontact multilayer thickness measurements; nondestructive testing techniques; nonmetal surfaces; perpendicular reflection geometry; photo-Dember effect; plastic coating; plastic production; quality control; reflection-mode terahertz time-domain spectroscopy; refraction indices; surface emitter; terahertz pulse generation; terahertz waves; wood industry; Coatings; Optical reflection; Optical sensors; Plastics; Thickness measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Europe (CLEO EUROPE/EQEC), 2011 Conference on and 12th European Quantum Electronics Conference
  • Conference_Location
    Munich
  • ISSN
    Pending
  • Print_ISBN
    978-1-4577-0533-5
  • Electronic_ISBN
    Pending
  • Type

    conf

  • DOI
    10.1109/CLEOE.2011.5942520
  • Filename
    5942520