• DocumentCode
    2056324
  • Title

    Accelerated laboratory ageing of model insulator samples with semiconducting glazes

  • Author

    Ullrich, Heike ; Gubanski, Stanislaw M.

  • Author_Institution
    Chalmers Univ. of Technol., Gothenburg, Sweden
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    274
  • Lastpage
    277
  • Abstract
    Semiconducting surfaces on outdoor insulators can improve performance under contaminated conditions. Numerous attempts have been undertaken to find suitable glaze compositions and today a range of reliable products is available. On the other hand, there are still concerns on the long-term stability of the semiconducting glazes and investigations aiming to find out the main ageing mechanisms, especially under DC voltage, are of great importance. In recent investigations, the authors found on insulator samples under natural field conditions, that similar surface changes took place under AC and DC voltage after several months of exposure. These changes were more severe for samples under DC stress. The aim of the investigations reported in this paper, was to model the ageing of samples with semiconducting glaze in the laboratory using the rotating-wheel-dip test. Besides the measurement of the voltage-current characteristics (I-V), dielectric spectroscopy was applied, in order to characterise the changes observed and to extend the knowledge concerning the conduction mechanism in the glaze before and after ageing
  • Keywords
    ageing; electric breakdown; electric current measurement; insulating coatings; insulator contamination; insulator testing; voltage measurement; I-V characteristics measurement; accelerated laboratory ageing; conduction mechanism; contaminated conditions; dielectric spectroscopy; insulating performance; long-term stability; model insulator samples; natural field conditions; outdoor insulators; rotating-wheel-dip test; semiconducting glazes; Accelerated aging; Glazes; Insulation; Laboratories; Semiconductivity; Semiconductor device testing; Stability; Stress; Surface contamination; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulating Materials, 2001. (ISEIM 2001). Proceedings of 2001 International Symposium on
  • Conference_Location
    Himeji
  • Print_ISBN
    4-88686-053-2
  • Type

    conf

  • DOI
    10.1109/ISEIM.2001.973645
  • Filename
    973645