DocumentCode
2056365
Title
Current-voltage and Optoelectronic Properties of Semiconducting ZnO Nanobelts
Author
Wang, Dingqu ; Zhu, Rong ; Zhou, Zhaoying ; Ye, Xiongying
Author_Institution
Dept. of Precision Instrum. & Mechanology, Tsinghua Univ., Beijing
fYear
2006
fDate
18-21 Jan. 2006
Firstpage
817
Lastpage
820
Abstract
We report on electrophoretic alignment of ZnO nanobelt bunches and their electrical and optical properties. The nanobelts were trapped onto a pair of electrodes by using alternating electrical current at frequency between 5 ~ 50 MHz and peak-to-peak amplitude from 2 to 20 V. Their electrical transport properties associated with the photoelectricity were studied at room temperature in the air ambient by using a xenon arc lamp source. Three typical IV characteristics were observed: asymmetry, symmetry and infinite impedance. The photoconductivity measurements show that the photocurrent through ZnO nanobelts increases as about 1.6 power of light intensity. The electron concentration Delta n is estimated to be 3.3times107 cm-1 at a bias voltage of -3V. Photocurrent decay was also studied through the experiment of photoresponse to illumination, and the decay time was estimated to be about 3 s. Collectively, ZnO nanobelts are demonstrated to be a remarkable optoelectronic material that holds wide applications for nanoscale photonic devices.
Keywords
II-VI semiconductors; electron density; nanostructured materials; photoconductivity; zinc compounds; Photocurrent decay; ZnO; alternating electrical current; current-voltage properties; electrical transport properties; electron concentration; optoelectronic properties; photoconductivity; photoelectricity; semiconducting nanobelts; Electrodes; Frequency; Impedance; Nanoscale devices; Photoconductivity; Photoelectricity; Semiconductivity; Temperature; Xenon; Zinc oxide; NEMS; ZnO nanobelt; photosensitivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Nano/Micro Engineered and Molecular Systems, 2006. NEMS '06. 1st IEEE International Conference on
Conference_Location
Zhuhai
Print_ISBN
1-4244-0139-9
Electronic_ISBN
1-4244-0140-2
Type
conf
DOI
10.1109/NEMS.2006.334903
Filename
4135076
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