• DocumentCode
    2056365
  • Title

    Current-voltage and Optoelectronic Properties of Semiconducting ZnO Nanobelts

  • Author

    Wang, Dingqu ; Zhu, Rong ; Zhou, Zhaoying ; Ye, Xiongying

  • Author_Institution
    Dept. of Precision Instrum. & Mechanology, Tsinghua Univ., Beijing
  • fYear
    2006
  • fDate
    18-21 Jan. 2006
  • Firstpage
    817
  • Lastpage
    820
  • Abstract
    We report on electrophoretic alignment of ZnO nanobelt bunches and their electrical and optical properties. The nanobelts were trapped onto a pair of electrodes by using alternating electrical current at frequency between 5 ~ 50 MHz and peak-to-peak amplitude from 2 to 20 V. Their electrical transport properties associated with the photoelectricity were studied at room temperature in the air ambient by using a xenon arc lamp source. Three typical IV characteristics were observed: asymmetry, symmetry and infinite impedance. The photoconductivity measurements show that the photocurrent through ZnO nanobelts increases as about 1.6 power of light intensity. The electron concentration Delta n is estimated to be 3.3times107 cm-1 at a bias voltage of -3V. Photocurrent decay was also studied through the experiment of photoresponse to illumination, and the decay time was estimated to be about 3 s. Collectively, ZnO nanobelts are demonstrated to be a remarkable optoelectronic material that holds wide applications for nanoscale photonic devices.
  • Keywords
    II-VI semiconductors; electron density; nanostructured materials; photoconductivity; zinc compounds; Photocurrent decay; ZnO; alternating electrical current; current-voltage properties; electrical transport properties; electron concentration; optoelectronic properties; photoconductivity; photoelectricity; semiconducting nanobelts; Electrodes; Frequency; Impedance; Nanoscale devices; Photoconductivity; Photoelectricity; Semiconductivity; Temperature; Xenon; Zinc oxide; NEMS; ZnO nanobelt; photosensitivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems, 2006. NEMS '06. 1st IEEE International Conference on
  • Conference_Location
    Zhuhai
  • Print_ISBN
    1-4244-0139-9
  • Electronic_ISBN
    1-4244-0140-2
  • Type

    conf

  • DOI
    10.1109/NEMS.2006.334903
  • Filename
    4135076