• DocumentCode
    2056390
  • Title

    Testability-oriented hardware/software partitioning

  • Author

    Traon, Yves Le ; Hayek, Ghassan Al ; Robach, Chantal

  • Author_Institution
    LSR, IMAG, Grenoble, France
  • fYear
    1996
  • fDate
    20-25 Oct 1996
  • Firstpage
    725
  • Lastpage
    731
  • Abstract
    In this paper a test-based hardware/software partitioning approach is presented for a co-design specification. Depending on the hardware or software implementation choice for each unit-level component, the test cost for the whole system is evaluated. The unit test costs are estimated by means of mutation-based analysis with respect to the implementation choices
  • Keywords
    design for testability; economics; logic partitioning; logic testing; co-design specification; cost algorithm; hardware/software partitioning; mutation-based analysis; testability; unit test costs; Algorithm design and analysis; Application software; Costs; Embedded system; Hardware; Partitioning algorithms; Signal processing algorithms; Software testing; System testing; Time factors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1996. Proceedings., International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-3541-4
  • Type

    conf

  • DOI
    10.1109/TEST.1996.557131
  • Filename
    557131