Title :
The microstructure due to RE-TM underlayer in a TbFeCo memory layer for high-density magneto-optical recording
Author :
Murakami, M. ; Birukawa, M.
Author_Institution :
Storage Media Syst. Dev. Center, Matsushita Electr. Ind. Co. Ltd., Kadoma, Japan
fDate :
March 30 2003-April 3 2003
Abstract :
In this paper, we investigate the seeding effect of an RE-TM amorphous magnetic multilayer for growing a TbFeCo memory layer and also discusses the feasibility of high-density recording on an MO medium. The saturation magnetization and coercivity of sample layers were analyzed.
Keywords :
amorphous magnetic materials; cobalt alloys; coercive force; crystal microstructure; ferromagnetic materials; iron alloys; magnetic multilayers; magnetic thin films; magneto-optical recording; sputtered coatings; terbium alloys; TbFeCo; TbFeCo memory layer; amorphous magnetic multilayer; coercivity; feasibility; magneto-optical recording; microstructure; saturation magnetization; seeding effect; Amorphous magnetic materials; Magnetic films; Magnetic properties; Magnetic recording; Magnetooptic effects; Magnetooptic recording; Microstructure; Perpendicular magnetic recording; Saturation magnetization; Sputtering;
Conference_Titel :
Magnetics Conference, 2003. INTERMAG 2003. IEEE International
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-7647-1
DOI :
10.1109/INTMAG.2003.1230877
