Title :
Thickness dependence of rotatable anisotropy in exchange-biased NiFe/FeMn bilayers
Author :
Kim, J.K. ; Kim, S.W. ; Kim, Byeong Koo ; Lee, S.S. ; Hwang, D.G.
Author_Institution :
Dept. of Phys., Dankook Univ., Cheonan, South Korea
fDate :
March 30 2003-April 3 2003
Abstract :
In this paper, we improved the AMR model to determinate the quantity and direction of rotatable anisotropy in the FeMn/NiFe with a thickness of AF and FM layers.
Keywords :
antiferromagnetic materials; ferromagnetic materials; iron alloys; magnetic anisotropy; magnetic hysteresis; magnetic thin films; manganese alloys; nickel alloys; NiFe-FeMn; exchange-biased NiFe/FeMn bilayers; rotatable anisotropy; Anisotropic magnetoresistance; Helium; Ion beams; Pins; Sputtering; Sun; Temperature;
Conference_Titel :
Magnetics Conference, 2003. INTERMAG 2003. IEEE International
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-7647-1
DOI :
10.1109/INTMAG.2003.1230886
