DocumentCode :
2057049
Title :
Modeling and performance evaluation of a controlled IC fab using distributed colored timed Petri net
Author :
Kuo, Chung-Hsien ; Huang, Han-Pang
Author_Institution :
Dept. of Mech. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Volume :
3
fYear :
2000
fDate :
2000
Firstpage :
2191
Abstract :
Proposes the modeling and performance evaluation of a controlled IC foundry fab using a distributed colored timed Petri net (DCTPN). A DCTPN is designed for highly model-mixed and flexible routing manufacturing systems. The distributed models can be integrated through communication places, and the manufacturing execution system (MES) can be executed using a COM (component object model) server place. Especially the process activities of a general IC foundry tool are analyzed, modeled and grouped into a basic tool model library. Based on the tool model library, an entire fab model can be constructed. The DCTPN-based fab model can act as a virtual fab, and be used to estimate fab performance and fab behaviors. In addition, the DCTPN conflict resolution and token competition rules are used to control a fab. Finally, a simplified 200 mm IC fab is presented and its system performance, including throughput, stage move, WIP (wafer in process) distribution, lot cycle time, and utilization, is evaluated. The operation histories of tools and lots are also included. The entire fab model has been verified in a real IC foundry fab
Keywords :
Petri nets; client-server systems; flexible manufacturing systems; graph colouring; integrated circuit manufacture; IC foundry fab; basic tool model library; communication places; component object model; conflict resolution; controlled IC fab; distributed colored timed Petri net; distributed models; highly model-mixed flexible routing manufacturing systems; lot cycle time; manufacturing execution system; operation histories; performance evaluation; server place; stage move; token competition rules; virtual fab; wafer in process distribution; Communication system control; Foundries; History; Integrated circuit modeling; Libraries; Manufacturing systems; Routing; System performance; Throughput; Virtual manufacturing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Robotics and Automation, 2000. Proceedings. ICRA '00. IEEE International Conference on
Conference_Location :
San Francisco, CA
ISSN :
1050-4729
Print_ISBN :
0-7803-5886-4
Type :
conf
DOI :
10.1109/ROBOT.2000.846353
Filename :
846353
Link To Document :
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