DocumentCode
2057716
Title
Changes of capacitance and dielectric dissipation factor of water-treed XLPE with voltage
Author
Ozaki, Tamon ; Ito, Noriyuki ; Sengoku, Issei ; Kawai, Jiro ; Nakamura, Shuhei
Author_Institution
Dept. of Electron., Mie Univ., Tsu, Japan
fYear
2001
fDate
2001
Firstpage
459
Lastpage
462
Abstract
In this article, the changes of capacitance C and dielectric dissipation factor tan δ of a non-penetrated water-treed XLPE sheet sample with voltage stress are discussed based upon the channel dynamism model. It has been found that the increase in tan δ with high voltage stress is caused by the growth of the conductive water-filled channel layer. The gradual decrease in tan δ with time of exposure to voltage stress is explained by a shift of relaxation frequency to higher range caused by the change in the conductivity of the water-filled channel layer
Keywords
XLPE insulation; capacitance; dielectric losses; trees (electrical); capacitance; channel dynamism model; conductive water-filled channel layer; dielectric dissipation factor; nonpenetrated water-treed XLPE; relaxation frequency; voltage stress; Capacitance; Circuits; Conductivity; Current measurement; Dielectrics; Frequency; Indium tin oxide; Polyethylene; Stress; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulating Materials, 2001. (ISEIM 2001). Proceedings of 2001 International Symposium on
Conference_Location
Himeji
Print_ISBN
4-88686-053-2
Type
conf
DOI
10.1109/ISEIM.2001.973702
Filename
973702
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