DocumentCode :
2058074
Title :
Subthreshold performance of deep-submicrometer dual gate material p-MOSFET and CMOS circuits for ultra low power analog/mixed-signal applications
Author :
Chakraborty, Saurav ; Mallik, Abhijit ; Sarkar, Chandan Kumar
Author_Institution :
Tyfone Commun. Dev. (India) Pvt. Ltd., Bangalore
fYear :
2008
fDate :
11-14 May 2008
Firstpage :
145
Lastpage :
150
Abstract :
Analog circuits based on subthreshold operation of CMOS devices are very attractive for ultra-low power, high gain and moderate frequency applications. The effect of dual material gate (DMG) on p-MOSFET for subthreshold analog operation is systematically investigated in this paper. As p- MOSFET plays a major role in CMOS circuits as active load, we simulated and studied the analog subthreshold performance parameters like output resistance (Ro), Early voltage (VA) and intrinsic gain of 100 nm DMG p-MOS devices. The features like transconductance enhancement and suppression of short-channel effects in DMG p- MOSFET were compared with that in the single material gate (SMG) p-MOSFET. We also studied the circuit performance of a CMOS amplifier and observed the improvement in gain for DMG p-MOS based circuit. The DMG CMOS devices are found to have significantly better performance as compared to their SMG counterpart. A more than 70% improvement in the voltage gain is observed for the CMOS amplifiers when dual-material gates, instead of single-material gates, are used in both the n- and p- channel devices.
Keywords :
CMOS analogue integrated circuits; amplifiers; circuit simulation; CMOS amplifiers; CMOS circuits; analog circuits; dual gate material; output resistance; p-MOS based circuit; p-MOS devices; p-MOSFET circuits; short-channel effects; subthreshold operation; transconductance; ultra-low power analog application; ultra-low power mixed-signal application; voltage gain; Analog circuits; CMOS analog integrated circuits; CMOS technology; Conducting materials; Frequency; Integrated circuit technology; MOSFET circuits; Performance gain; Transconductance; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronics, 2008. MIEL 2008. 26th International Conference on
Conference_Location :
Nis
Print_ISBN :
978-1-4244-1881-7
Electronic_ISBN :
978-1-4244-1882-4
Type :
conf
DOI :
10.1109/ICMEL.2008.4559244
Filename :
4559244
Link To Document :
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