• DocumentCode
    2058074
  • Title

    Subthreshold performance of deep-submicrometer dual gate material p-MOSFET and CMOS circuits for ultra low power analog/mixed-signal applications

  • Author

    Chakraborty, Saurav ; Mallik, Abhijit ; Sarkar, Chandan Kumar

  • Author_Institution
    Tyfone Commun. Dev. (India) Pvt. Ltd., Bangalore
  • fYear
    2008
  • fDate
    11-14 May 2008
  • Firstpage
    145
  • Lastpage
    150
  • Abstract
    Analog circuits based on subthreshold operation of CMOS devices are very attractive for ultra-low power, high gain and moderate frequency applications. The effect of dual material gate (DMG) on p-MOSFET for subthreshold analog operation is systematically investigated in this paper. As p- MOSFET plays a major role in CMOS circuits as active load, we simulated and studied the analog subthreshold performance parameters like output resistance (Ro), Early voltage (VA) and intrinsic gain of 100 nm DMG p-MOS devices. The features like transconductance enhancement and suppression of short-channel effects in DMG p- MOSFET were compared with that in the single material gate (SMG) p-MOSFET. We also studied the circuit performance of a CMOS amplifier and observed the improvement in gain for DMG p-MOS based circuit. The DMG CMOS devices are found to have significantly better performance as compared to their SMG counterpart. A more than 70% improvement in the voltage gain is observed for the CMOS amplifiers when dual-material gates, instead of single-material gates, are used in both the n- and p- channel devices.
  • Keywords
    CMOS analogue integrated circuits; amplifiers; circuit simulation; CMOS amplifiers; CMOS circuits; analog circuits; dual gate material; output resistance; p-MOS based circuit; p-MOS devices; p-MOSFET circuits; short-channel effects; subthreshold operation; transconductance; ultra-low power analog application; ultra-low power mixed-signal application; voltage gain; Analog circuits; CMOS analog integrated circuits; CMOS technology; Conducting materials; Frequency; Integrated circuit technology; MOSFET circuits; Performance gain; Transconductance; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics, 2008. MIEL 2008. 26th International Conference on
  • Conference_Location
    Nis
  • Print_ISBN
    978-1-4244-1881-7
  • Electronic_ISBN
    978-1-4244-1882-4
  • Type

    conf

  • DOI
    10.1109/ICMEL.2008.4559244
  • Filename
    4559244