DocumentCode
2058268
Title
Effects of multi-product, small-sized production of LSIs packaged in various packages on the final test process efficiency and cost
Author
Fujioka, Hiromu ; Nakamae, Koji ; Higashi, Akio
Author_Institution
Fac. of Eng., Osaka Univ., Japan
fYear
1996
fDate
20-25 Oct 1996
Firstpage
793
Lastpage
799
Abstract
Effects of multi-product, small-sized production of LSIs packaged in various packages on the final test process efficiency and cost are evaluated through an event-driven simulation analysis which includes detailed parametric models
Keywords
circuit analysis computing; computer testing; data structures; digital simulation; economics; integrated circuit manufacture; integrated circuit testing; large scale integration; LSI; cost; event-driven simulation analysis; final test process efficiency; multi-product small-sized production; one chip microcomputer; parametric models; simulation; Costs; Discrete event simulation; Large scale integration; Mass production; Microcomputers; Packaging; Parametric statistics; Production systems; Testing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1996. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-3541-4
Type
conf
DOI
10.1109/TEST.1996.557139
Filename
557139
Link To Document