• DocumentCode
    2058345
  • Title

    Conductivity and breakdown of solid dielectrics under the influence of electric and magnetic field

  • Author

    Paul, J.C.

  • Author_Institution
    Dept. of Electrical, Electron. & Telecommun. Eng., Netaji Subhash Eng. Coll., Calcutta, India
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    557
  • Lastpage
    561
  • Abstract
    The range of solid dielectrics available for use in the field of electrical and electronics engineering are wide and properties of these materials are equally diverse. Apart from physical and chemical properties there are other innumerable factors that contribute to the dielectric behaviour of insulating materials. The interaction and interdependence of these factors are so complex that even a century of research work has not rendered any unified approach to the study of process of ionization, conduction and breakdown mechanism in dielectric media. Solid dielectrics as used in the field of electrical and electronics are not only subjected to electric field, but also under the influence of both electric and magnetic fields. Considering this, an attempt has been made in this paper to explain the conductivity of solid dielectric under the influence of both electric and magnetic fields which has not been presented so far in the available literature. A generalised mathematical treatment of conduction current of dielectric materials in the presence of both electric and cross-magnetic field has been also presented
  • Keywords
    current density; dielectric relaxation; electric breakdown; electrical conductivity; insulating materials; breakdown mechanism; conduction current; conductivity; dielectric behaviour; electric field; insulating materials; ionization; magnetic field; solid dielectrics; Cathodes; Conductivity; Dielectric breakdown; Dielectric materials; Electric breakdown; Ionization; Magnetic fields; Solids; Temperature dependence; Temperature distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulating Materials, 2001. (ISEIM 2001). Proceedings of 2001 International Symposium on
  • Conference_Location
    Himeji
  • Print_ISBN
    4-88686-053-2
  • Type

    conf

  • DOI
    10.1109/ISEIM.2001.973728
  • Filename
    973728