• DocumentCode
    2058504
  • Title

    Algorithmic extraction of BSDL from 1149.1-compliant sample ICs

  • Author

    Raymond, Douglas W. ; Wedge, D. ; Stringer, Philip J. ; Ng, Harold W. ; Jennings, Suzanne T. ; Pynn, Craig T. ; Soule, Winsor, Jr.

  • Author_Institution
    Assembly Test Group, Teradyne Inc., USA
  • fYear
    1995
  • fDate
    21-25 Oct 1995
  • Firstpage
    561
  • Lastpage
    568
  • Abstract
    BSDL files are essential for boundary-scan testing. However, they are hard to obtain, and frequently incorrect. We describe a tool which automatically extracts a basic BSDL file from a sample IC
  • Keywords
    automatic testing; boundary scan testing; design for testability; hardware description languages; integrated circuit design; integrated circuit testing; 1149.1-compliant sample ICs; ATPG; BSDL; IC design; algorithmic extraction; boundary scan description language; boundary-scan testing; scannable ICs; Assembly; Automatic test pattern generation; Automatic testing; Computer architecture; Fixtures; Integrated circuit testing; Machinery; Manufacturing; Software testing; Writing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1995. Proceedings., International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-2992-9
  • Type

    conf

  • DOI
    10.1109/TEST.1995.529884
  • Filename
    529884
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2058504