DocumentCode
2058552
Title
A note on solar cell diagnostics using LBIC and LBIV methods
Author
Salinger, Jan ; Benda, Vitezslav ; Machacek, Zdenek
Author_Institution
Dept. Electr. Technol., Czech Tech. Univ. in Prague, Prague
fYear
2008
fDate
11-14 May 2008
Firstpage
217
Lastpage
220
Abstract
LBIC and LBIV methods are widely used for diagnosing solar cell homogeneity. This paper deals with the possibility of conducting LBIC measurements on the LBIV measuring device. These two methods are compared theoretically, and also by looking at the maps of the examined solar cells. Attention is paid to the working point of the LBIC method, which applies not only for modified LBIV devices but for all measurements of short circuit current.
Keywords
OBIC; solar cells; LBIC; LBIV; solar cell diagnostics; Current measurement; Electrical resistance measurement; Equations; Integrated circuit measurements; Laser beams; Photovoltaic cells; Position measurement; Short circuit currents; Voltage measurement; Wavelength measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronics, 2008. MIEL 2008. 26th International Conference on
Conference_Location
Nis
Print_ISBN
978-1-4244-1881-7
Electronic_ISBN
978-1-4244-1882-4
Type
conf
DOI
10.1109/ICMEL.2008.4559262
Filename
4559262
Link To Document