DocumentCode
2058653
Title
Amplification of space charge waves of short wave part of millimeter wave range in n-GaN films
Author
Grimalsky, V. ; Koshevaya, S. ; Diaz-A, F. ; Escobedo-A, J.
Author_Institution
Autonomous Univ. of Morelos (UAEM), Cuernavaca
fYear
2008
fDate
11-14 May 2008
Firstpage
233
Lastpage
236
Abstract
An amplification of space charge waves (SCW) due to the negative differential conductivity in n-GaN films placed onto a semi-infinite substrate is considered and possible spatial increments are calculated. Both diffusion-drift equations for volume electron concentration and also an approximation of two-dimensional electron gas were used jointly with the Poisson equation for the electric field. When compared with a case of the n-GaAs film, it is possible to observe an amplification of SCW in n-GaN films of submicron thicknesses at essentially higher frequencies f ges 100 GHz. It is possible to obtain high (~10 kV/cm) output electric fields of the short wave part of the millimeter wave range. Direct numerical simulations of nonlinear equations of motion confirm the results of calculations of spatial increments in the film of a finite thickness.
Keywords
III-V semiconductors; Poisson equation; diffusion; electrical conductivity; electron density; gallium compounds; nonlinear equations; semiconductor thin films; space charge waves; two-dimensional electron gas; wide band gap semiconductors; GaN; Poisson equation; diffusion-drift equation; frequency 100 GHz; n-GaN film; negative differential conductivity; nonlinear equations; space charge wave amplification; two-dimensional electron gas; volume electron concentration; Conductive films; Conductivity; Dielectric substrates; Electron mobility; Frequency; Gallium arsenide; Gallium nitride; Microelectronics; Poisson equations; Space charge;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronics, 2008. MIEL 2008. 26th International Conference on
Conference_Location
Nis
Print_ISBN
978-1-4244-1881-7
Electronic_ISBN
978-1-4244-1882-4
Type
conf
DOI
10.1109/ICMEL.2008.4559266
Filename
4559266
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