• DocumentCode
    2058653
  • Title

    Amplification of space charge waves of short wave part of millimeter wave range in n-GaN films

  • Author

    Grimalsky, V. ; Koshevaya, S. ; Diaz-A, F. ; Escobedo-A, J.

  • Author_Institution
    Autonomous Univ. of Morelos (UAEM), Cuernavaca
  • fYear
    2008
  • fDate
    11-14 May 2008
  • Firstpage
    233
  • Lastpage
    236
  • Abstract
    An amplification of space charge waves (SCW) due to the negative differential conductivity in n-GaN films placed onto a semi-infinite substrate is considered and possible spatial increments are calculated. Both diffusion-drift equations for volume electron concentration and also an approximation of two-dimensional electron gas were used jointly with the Poisson equation for the electric field. When compared with a case of the n-GaAs film, it is possible to observe an amplification of SCW in n-GaN films of submicron thicknesses at essentially higher frequencies f ges 100 GHz. It is possible to obtain high (~10 kV/cm) output electric fields of the short wave part of the millimeter wave range. Direct numerical simulations of nonlinear equations of motion confirm the results of calculations of spatial increments in the film of a finite thickness.
  • Keywords
    III-V semiconductors; Poisson equation; diffusion; electrical conductivity; electron density; gallium compounds; nonlinear equations; semiconductor thin films; space charge waves; two-dimensional electron gas; wide band gap semiconductors; GaN; Poisson equation; diffusion-drift equation; frequency 100 GHz; n-GaN film; negative differential conductivity; nonlinear equations; space charge wave amplification; two-dimensional electron gas; volume electron concentration; Conductive films; Conductivity; Dielectric substrates; Electron mobility; Frequency; Gallium arsenide; Gallium nitride; Microelectronics; Poisson equations; Space charge;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics, 2008. MIEL 2008. 26th International Conference on
  • Conference_Location
    Nis
  • Print_ISBN
    978-1-4244-1881-7
  • Electronic_ISBN
    978-1-4244-1882-4
  • Type

    conf

  • DOI
    10.1109/ICMEL.2008.4559266
  • Filename
    4559266