DocumentCode :
2058673
Title :
Low-voltage area prediction model research based on self-organizing competitive neural network
Author :
Zhang Ying ; Zhang Shu-xin ; Ru Wei-kang ; Wu Cai-biao ; Chen Yong
Author_Institution :
Qingpu Power Supply Co., SMEPC, Shanghai, China
fYear :
2012
fDate :
10-14 Sept. 2012
Firstpage :
1
Lastpage :
5
Abstract :
The distribution network voltage level is directly related to residents´ normal use of electricity, in order to correctly predict the low-voltage distribution network voltage quality, to take timely and effective means to prevent low-voltage phenomenon, the article collects nine indicators to reflect the characteristics of low-voltage distribution network voltage quality which are mainline diameter, mainline type, branch line diameter, branch line type, power supply radius, distribution transformer capacity -load ratio, the three-phase load unbalance rate, single-phase-home number, reactive power compensation rate. Then the article establishes a self-organizing competitive neural network model to automatic cluster the samples into three kinds which are normal, existing low voltage risk and existing severe low voltage risk. Using the known practical result to compare with the calculation results will indicate that the network model has high accuracy and feasibility.
Keywords :
distribution networks; neural nets; reactive power control; branch line diameter; branch line type; distribution network voltage level; distribution transformer capacity-load ratio; low-voltage area prediction model; low-voltage distribution network voltage quality; mainline diameter; mainline type; power supply radius; reactive power compensation rate; self-organizing competitive neural network; single-phase-home number; three-phase load unbalance rate; Voltage quality; automatic clustering; low-voltage of distribution network; self-organizing competitive neural network;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electricity Distribution (CICED), 2012 China International Conference on
Conference_Location :
Shanghai
ISSN :
2161-7481
Print_ISBN :
978-1-4673-6065-4
Electronic_ISBN :
2161-7481
Type :
conf
DOI :
10.1109/CICED.2012.6508513
Filename :
6508513
Link To Document :
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