Title :
Analysis of development of electrical trees in insulators using local fractal dimension
Author :
Fujii, M. ; Iwase, T. ; Ihori, H. ; Arii, K.
Author_Institution :
Fac. of Eng., Ehime Univ., Matsuyama, Japan
Abstract :
Patterns of electrical trees in insulators are estimated numerically by fractal dimension. However they are not simple fractal but multifractal. They can be estimated by global spectrum and singularity, which do not have clear local information. A local fractal dimension and its spectrum are introduced. Local fractal dimension maps of impulse trees were calculated and the development considered by it and its spectrum. The change of the pattern of the impulse trees in applying the next impulse voltage can be predicted by considering the difference in the local fractal dimension spectrum in each stage
Keywords :
fractals; impulse testing; insulation testing; trees (electrical); electrical trees; global spectrum; impulse trees; impulse voltage; local fractal dimension; multifractal. dimension; singularity; Classification tree analysis; Dielectrics and electrical insulation; Electrodes; Fractals; Length measurement; Needles; Pattern analysis; Probability; Trees - insulation; Voltage measurement;
Conference_Titel :
Electrical Insulating Materials, 2001. (ISEIM 2001). Proceedings of 2001 International Symposium on
Conference_Location :
Himeji
Print_ISBN :
4-88686-053-2
DOI :
10.1109/ISEIM.2001.973745
