Title : 
A linear CMOS voltage-to-current converter
         
        
            Author : 
Chen, Roger Yubtzuan ; Hung, Tsung-Shuen
         
        
            Author_Institution : 
Dept. of Electron. Eng., Nat. Yunlin Univ. of Sci. & Technol., Taiwan
         
        
        
        
        
        
            Abstract : 
An improved CMOS voltage-to-current converter is presented. PMOS transistors are employed in the resistor-replacement and voltage-level shifting of the proposed converter to avoid the body effect. To accurately annihilate the nonlinear voltage terms, a better modeling of the drain-to-source current of the MOS transistor operating in the linear region is essential and is adopted. Specifically the substrate-bias effect of the MOS transistor is treated more thoroughly in our design. Consequently, the nonlinearity of the large-signal transresistance of the converter, caused mainly by the body effect of a NMOS transistor in a previously published converter, is greatly minimized. The voltage-to-current converter is designed and fabricated in a 0.35 μm CMOS technology. The fabricated circuit occupies an area of 430 μm × 260 μm (≈12mm-2) and dissipates less than 2.2 mW from a 3.3 V supply. The measured and simulated data are in good agreement. For a 1 VP-P input voltage, the total harmonic distortion (THD) of the output current is less than 1.5%.
         
        
            Keywords : 
CMOS analogue integrated circuits; MOSFET; convertors; harmonic distortion; integrated circuit modelling; 0.35 micron; 1 V; 3.3 V; MOS transistors; PMOS transistors; drain-to-source current modeling; large-signal transresistance; linear CMOS voltage-to-current converter; total harmonic distortion; voltage-level shifting; Biomedical signal processing; CMOS technology; Circuits; Linearity; MOS devices; MOSFETs; Nonlinear equations; Resistors; Semiconductor device modeling; Voltage;
         
        
        
        
            Conference_Titel : 
Signals, Circuits and Systems, 2005. ISSCS 2005. International Symposium on
         
        
            Print_ISBN : 
0-7803-9029-6
         
        
        
            DOI : 
10.1109/ISSCS.2005.1511331