Title :
Improving board and system test: a proposal to integrate boundary scan and IDDQ
Author :
Reed, Douglas ; Doege, Jason ; Rubio, Antonio
Author_Institution :
Lockheed Martin Space Oper., Kennedy Space Centre, FL, USA
Abstract :
IDDQ/ISSQ testing has been a popular topic for production testing of CMOS integrated circuits (ICs). Although this type of testing shows promise for board and system level testing, there exist limitations in the implementation of such testing. This paper proposes integrating boundary scan and IDDQ testing at the integrated circuit level so that IDDQ testing can be accomplished at the board and system level for improved system reliability
Keywords :
CMOS integrated circuits; automatic testing; boundary scan testing; built-in self test; failure analysis; integrated circuit testing; printed circuit testing; production testing; IDDQ testing; board testing; boundary scan test; integrated circuit level; production testing; system level testing; system reliability; CMOS digital integrated circuits; CMOS integrated circuits; Circuit testing; Condition monitoring; Current measurement; Integrated circuit testing; Manufacturing; Proposals; System testing; Wire;
Conference_Titel :
Test Conference, 1995. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2992-9
DOI :
10.1109/TEST.1995.529886
