• DocumentCode
    2058809
  • Title

    Improving board and system test: a proposal to integrate boundary scan and IDDQ

  • Author

    Reed, Douglas ; Doege, Jason ; Rubio, Antonio

  • Author_Institution
    Lockheed Martin Space Oper., Kennedy Space Centre, FL, USA
  • fYear
    1995
  • fDate
    21-25 Oct 1995
  • Firstpage
    577
  • Lastpage
    585
  • Abstract
    IDDQ/ISSQ testing has been a popular topic for production testing of CMOS integrated circuits (ICs). Although this type of testing shows promise for board and system level testing, there exist limitations in the implementation of such testing. This paper proposes integrating boundary scan and IDDQ testing at the integrated circuit level so that IDDQ testing can be accomplished at the board and system level for improved system reliability
  • Keywords
    CMOS integrated circuits; automatic testing; boundary scan testing; built-in self test; failure analysis; integrated circuit testing; printed circuit testing; production testing; IDDQ testing; board testing; boundary scan test; integrated circuit level; production testing; system level testing; system reliability; CMOS digital integrated circuits; CMOS integrated circuits; Circuit testing; Condition monitoring; Current measurement; Integrated circuit testing; Manufacturing; Proposals; System testing; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1995. Proceedings., International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-2992-9
  • Type

    conf

  • DOI
    10.1109/TEST.1995.529886
  • Filename
    529886
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2058809