Title :
Free-running quantum dot SESAM modelocked VECSEL with record-low timing jitter
Author :
Wittwer, V.J. ; Zaugg, C.A. ; Pallmann, W.P. ; Oehler, A.E.H. ; Rudin, B. ; Hoffmann, M. ; Golling, M. ; Barbarin, Y. ; Südmeyer, T. ; Keller, U.
Author_Institution :
Dept. of Phys., ETH Zurich, Zurich, Switzerland
Abstract :
Our laser is an InGaAs quantum well VECSEL operating at 953 nm passively modelocked with a quantum dot SESAM. It generates 4.6-ps pulses with 2 GHz repetition rate and 50 mW average output power. High mechanical stability is achieved by fixing all optical elements including the pump diode in a metallic housing avoiding air currents and reducing vibrations. This laser is free-running, the cavity length is not actively stabilized. Only the VECSEL heat sink is maintained at 15°C, while pump diode temperature and base plate temperature are not stabilized. The phase noise of the free-running laser integrated over a bandwidth from 100 Hz to 1 MHz corresponds to an RMS timing jitter of ≈212 fs, which is lower than previously obtained for modelocked VECSELs. Our measurements confirm that well-designed OP-VECSELs can achieve comparable low-noise performance as standard ion-doped solid-state lasers.
Keywords :
heat sinks; laser mode locking; mirrors; optical pumping; optical saturable absorption; phase noise; quantum dot lasers; quantum well lasers; surface emitting lasers; timing jitter; InGaAs; RMS timing jitter; VECSEL heat sink; air currents; base plate temperature; cavity length; free-running laser; free-running quantum dot SESAM modelocked VECSEL; frequency 100 Hz to 1 MHz; mechanical stability; metallic housing; optical elements; phase noise; power 50 mW; pump diode temperature; quantum well VECSEL; record-low timing jitter; temperature 15 C; time 4.6 ps; wavelength 953 nm; Laser modes; Laser noise; Quantum dot lasers; Semiconductor device modeling; Surface emitting lasers; Timing jitter;
Conference_Titel :
Lasers and Electro-Optics Europe (CLEO EUROPE/EQEC), 2011 Conference on and 12th European Quantum Electronics Conference
Conference_Location :
Munich
Print_ISBN :
978-1-4577-0533-5
Electronic_ISBN :
Pending
DOI :
10.1109/CLEOE.2011.5942638